Application of statistical theory in VLSI

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统计学理论在超大规模集成电路中的应用实践研究

Research on Statistics and Application / 2020,2(1): 30-37 / 2020-05-13 look

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Authors: 严涛
Information:
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南昌大学，南昌
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Keywords: 超大规模集成电路；概率统计；电压降
VLSI; Probability Statistics ; IR-drop
Abstract: 在认真研究电源网格结构的基础上，介绍了一种电压降分析的新方法。这种基于概率统计的方法能够快速简便的估计出电压降的概率分布情况。这种利用概率统计分析电压降的方法在一些电源网格（包括一些工业处理器）中得到了较为理想的结果。
With a thorough research on the structure of power grid, we put forward a new kind of approach to the IR drop problem. This approach is based on probability and statistics, which can give us an outlook of the probability distribution of IR drop. The analysis was carried out on a number of grids, including the power grids of industrial processors and we can see that this approach is very effective.
DOI: https://doi.org/10.35534/rsa.0201005c
Cite: 严涛．统计学理论在超大规模集成电路中的应用实践研究［J］．统计与应用研究，2020，2（1）：30-37．